Optical Properties of Epitaxial Plt Thin Films
نویسندگان
چکیده
منابع مشابه
architecture and engineering of nanoscale sculptured thin films and determination of their properties
چکیده ندارد.
15 صفحه اولInfrared optical properties of La0.7Ca0.3MnO3 epitaxial films
The reflectance of La0.7Ca0.3MnO3 epitaxial thin films on perovskite substrates with a range of lattice constants is studied in the frequency range 50–5000 cm. The complex dielectric functions of the bare La0.7Ca0.3MnO3 films are obtained by modeling the measured reflectivity spectra of the two-layer La0.7Ca0.3MnO3/substrate system with separately measured dielectric functions of the bare subst...
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Molybdenum thin films with 50 and 150 nm thicknesses were deposited on silicon substrates, using DC magnetron sputtering system, then post-annealed at different temperatures (200, 325, 450, 575 and 700°C) with flow oxygen at 200 sccm (standard Cubic centimeter per minute). The crystallographic structure of the films was obtained by means of x-ray diffraction (XRD) analysis. An atomic force micr...
متن کاملStructural, Electrical and Optical Properties of Molybdenum Oxide Thin Films Prepared by Post-annealing of Mo Thin Films
Molybdenum thin films with 50 and 150 nm thicknesses were deposited on silicon substrates, using DC magnetron sputtering system, then post-annealed at different temperatures (200, 325, 450, 575 and 700°C) with flow oxygen at 200 sccm (standard Cubic centimeter per minute). The crystallographic structure of the films was obtained by means of x-ray diffraction (XRD) analysis. An atomic force micr...
متن کاملEpitaxial growth of thin films
The term ‘epitaxial’ is applied to a film grown on top of the crystalline substrate in ordered fashion that atomic arrangement of the film accepts crystallographic structure of the substrate. Epitaxial growth is one of the most important techniques to fabricate various ‘state of the art’ electronic and optical devices. Modern devices require very sophisticated structure, which are composed of t...
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ژورنال
عنوان ژورنال: MRS Proceedings
سال: 1995
ISSN: 0272-9172,1946-4274
DOI: 10.1557/proc-401-267